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Mingdong Dong


MD Dong

Professor Interdisciplinary Nanoscience Center - INANO-Fysik, iNANO-huset

Keywords

  • Atomic Force Microscopy
  • Nanodevices
  • Size-dependent properties
  • Low Dimensional materials
  • Nanomechanics
  • Electronic materials
  • Surface Science
  • Functional Nanomaterals

Head of BioSPM Group

Professor Mingdong Dong
PhD in Applied Physics

Scanning probe methods for a combined structural and functional characterization

The group works with development and application of advanced scanning probe methods (SPM) for the characterization of micro- and nanoscale materials.

Our research focuses on identifying the functional properties of materials in air and liquid using a number of different SPMs. We have developed a novel atomic force microscope (AFM) platform for quantitative nanomechanical imaging methods, including microsecond force spectroscopy and microsecond single-molecule recognition spectroscopy. In another study, we have developed a new mode for the scanning ion conductance microscope (SICM) capable of quantifying the density of surface charges in solution. The advanced AFM techniques provide sub-molecular resolution and high-scanning speeds and have been applied to study dynamic and physical properties of biological systems, such as the abnormal conformational transitions of proteins associated with amyloid-related diseases. The new SICM mode was used to quantify the surface charge of different lipid bilayers and can provide valuable information about the membrane systems, which could prove useful for drug delivery.

The combination of structure and functional properties provides new insight into events occurring at the nanoscale.

Many projects involve collaborations with international leading companies such as Lundbeck A/S, Novo Nordisk A/S, DuPont Danisco, Danish Technological Institute, Carlsberg A/S, Park Systems and Bruker USA. These industry collaborations enable us to extend our established fundamental academic platform to applied technology.

Recent publications