Professor Anders Mikkelsen, Department of Physics, Synchrotron Radiation Research, Lund University

Direct Imaging of  Low Dimensional Structures to Ångström Length and Attosecond Time Scales

We work towards combining novel atomic scale surface/interface spectromicroscopy, advanced light sources, and material science for tailoring low dimensional structures. This allow development and use of a new generation of imaging techniques with orders of magnitude better resolution in both time and space for studying complex nanostructures and devices during operation.  Two main themes will be covered: Firstly, we have developed and used scanning probe microscopy and high brightness synchrotron based microscopy to determine structure, chemistry and physical properties of III-V semiconductor nanowires. We have for example developed novel methods to directly image surfaces both inside, outside and topside of nanowires down to the single atom level, revealing geometric structure as well as both electrical and mechanical properties. Most recently we have extended this too direct imaging of nanowire devices in operation. Using our rather diverse toolbox we can obtain a real understanding of the connections between structure, growth and function of these nanowires - some with potential applications in IT, energy and life-science. Secondly, we combine IR, blue and XUV laser pulses from femtosecond to the attosecond range with PhotoEmission Electron Microscopy (PEEM) to study electron dynamics in nanoscale structures[6]. The combination of advanced lasers and PEEM allows for very sensitive measurements of plasmonics fields, surface chemistry and pump-probe experiments on ultrafast time scales - all in the same picture.

Host: Associate professor Jeppe Vang Lauritsen, Interdisciplinary Nanoscience Center, Aarhus University