The SE 850 PV is a UV-VIS-NIR spectroscopic ellipsometer with a spectral range of 240 nm – 2500 nm. The spectroscopic ellipsometer is based on a highly sensitive CCD array detection system in the UV-VIS range, allowing measurement on textured silicon solar cells even at low incident angles of 50 deg.
Measuring film thickness (up to 10.000 nm for transparent films) and measuring refractive index.
Mapping film thickness up to a 50 x 50 mm area.
Bjarke Rolighed Jeppesen